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CEMS Faculty
Ph.D., Applied Physics, Cornell University, 2004.
M.S., Applied and Engineering Physics, Cornell University, 2003.
B.Sc. (Hons.), Physics, Yerevan State University, Armenia, 1996. Research Areas
Electronic, Photonic and Magnetic Materials
My research interests are in analytical electron microscopy and spectroscopy, nanomaterials, defects and interface. The current research is focused on understanding basic electronic and structural propertied of the nano-materials, quantum dots and heterostructures using atomic-resolution scanning and transmission electron microscopy, measuring local densities of states of the materials and their crystal structures and, also, developing quantitative interpretation of electron beam interaction with specimens.
Selected Publications
| O. Ozatay, K.W. Tan, P.G. Gowtham, J.C. Read, K.A. Mkhoyan, M.G. Thomas, G.D. Fuchs, P.M. Braganca, E.M. Ryan. K.V. Thadani, J.C. Sankey, J. Silcox, D.C. Ralph, R.A. Buhrman, Sidewall Oxide Effects on the Thermal Stability, Magnetic Damping and Low Temperature Reversal Characteristics of Thin Film Nanomagnets, Nature Materials 7, 567 (2008). |
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| K.A. Mkhoyan, S.E. Maccagnano-Zacher, E.J. Kirkland and J. Silcox, Effects of amorphous layer on high-resolution ADF-STEM imaging, Ultramicroscopy 108, 791 (2008); S.E. Maccagnano-Zacher, K.A. Mkhoyan, E.J. Kirkland and J. Silcox, Effects of specimen tilt on high-resolution ADF-STEM imaging, Ultramicroscopy 108, 718 (2008). |
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| K.A. Mkhoyan, S.E. Maccagnano-Zacher, M.G. Thomas and J. Silcox, Critical role of inelastic scattering in quantitative electron microscopy, Phys. Rev. Lett. 100, 025503 (2008). |
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| K.A. Mkhoyan, T. Babinec, S.E. Maccagnano, E.J. Kirkland and J. Silcox, Separation of bulk and surface-losses in low-loss EELS measurements in STEM, Ultramicroscopy, 107, 345 (2007). |
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| K.A. Mkhoyan, P.E. Batson, J. Cha, W.J. Schaff and J. Silcox, Direct Determination of Local Lattice Polarity in Crystals, Science 312, 1354 (2006). |
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| K.A. Mkhoyan, J. Silcox, M.A. McGuire and F.J. DiSalvo, Radiolitic purification of CaO by electron microscope, Phil. Mag. 86, 2907 (2006). |
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| K.A. Mkhoyan, J. Silcox, A. Ellison, D. Ast, R. Dieckmann, Full recovery of electron damage in glass at ambient temperatures, Phys. Rev. Lett. 96, 205506 (2006). |
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| K.A. Mkhoyan, J. Silcox, E.S. Alldredge, N.W. Ashcroft, H. Lu, W.J. Schaff and L.F. Eastman, Measuring electronic structure of wurtzite InN using electron energy loss spectroscopy, Appl. Phys. Lett. 82, 1407 (2003). |
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Current Research Staff
Aloysius Gunawan, Anudha Mittal, Michael Odlyzko, Whitney Shook, Andrew Wagner
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