PROCEEDINGS
M1	Briant, C.L., Carter, C.B. and Hall, E.L, 1997, Interfacial Engineering for Optimized Properties, Fall 1996, Mat. Res. Soc. Symp. Proc. 458
M2	Thomas, G., Carter, C.B., De Hosson, J.Th.M., Gerberich, W.W., Gronsky, R., Humphreys, C.L., Nix, W.D., Rühle, M., Seidman, D.N. and Williams, D.B., 1999, Materials Science and Mechanics of Interfaces, 25-30 Oct. 1998, Acta Mater. 47(15-16).
M3	Carter, C.B. and Hall, E.L, Nutt, S. and Briant, C.L., 1999, Interfacial Engineering for Optimized Properties II, 2000, Mat. Res. Soc. Symp. Proc. 586
M4	Carter, C.B., Pan, X., Sickafus, K., Tuller, H.L. and Wood, T., 2000 Structure-Property Relationships of Oxide Surfaces and Interfaces , 2001, Mat. Res. Soc. Symp. Proc. 654
M5	Alexander, K.B., Carter, C.B., Grimes, R.W., Pan, X., and Wood, T.E., 2003 Structure-Property Relationships of Oxide Surfaces and Interfaces II, Mater. Res. Soc. Proc. 751

BOOK CHAPTERS
A1	Norton, M.G. and Carter, C.B., 1992, in Atomic-Level Properties of Interface Materials, Eds D. Wolf and S. Yip (Chapman and Hall, London) 151-189, "Grain and Interphase Boundaries in Ceramics and Ceramic Composites."
A2	Norton, M.G. and Carter, C.B., 1994, in Interfaces in High-Tc Superconducting Systems, Eds S.L. Shinde and D.A. Rudman (Springer-Verlag, New York) 1-27, "Observations on the Growth of YB_Cu3O7-_ Thin Films by Transmission Electron Microscopy."
A3	Farrer, J.K., Carter, C.B. and Michael, J., 2000 in Electron Backscatter Diffraction in Materials Science, Eds A.J.Schwartz, M. Kumar and B.L. Adams (Plenum, New York) 299-318 "EBSP of Ceramics Materials".