C. Daniel Frisbie Group
Chemical Engineering & Materials Science
University of Minnesota - Twin Cities
Films & Interfaces,
Molecular Crystals,
Molecular Electronics,
Organic Semiconductors,
Scanning Probe Microscopy

Bong Soo Kim Bong Soo Kim
Korea University - Seoul; 2000
B.S. Chemistry
Korea University - Seoul; 2002
M.S. Organic Chemistry
Email: kimx0921@tc.umn.edu


Study of Molecular Junctions Based on SAMs of Aryl Isocyanides and Ferrocene-terminated Alkanethiols

Organic compounds have the potential to serve as molecular components of electronic devices. Metal-molecule-metal junctions have recently shown diverse charge transport behavior including coulomb blockade, current rectification, switching, negative differential resistance, and Kondo resonance. Molecular junctions based on aryl thiols on metals have been extensively investigated. However, I-V characteristics of aryl isocyanides have not yet been studied. Thus, my research will be focused on junctions with isocyanobenzene (PhNC), 2-isocyanonaphthalene (NaphNC), 2-isocyanoanthracene (AntNC), revealing the dependence of conjugated length and effect of metal work function on tunneling efficiency and contact resistance.

In addition, the implantation of redox-active molecules into a molecular junction is expected to show single electron tunneling (SET) phenomena obtained by fabricating conductive islands between metals isolated dielectric materials. The second research topic is aimed at establishing a device showing SET by utilizing ferrocene (Fc)-terminated thiols (Fc(CH2)nSH, n = 6, 8, 11) embedded in longer alkanethiols. This research will be achieved by building SAMs of molecular wires and measuring I-V characteristics by conductive probe-atomic force microscopy (CP-AFM). Films will be characterized by using reflection-absorption infrared spectroscopy (IRRAS), ellipsomety, X-ray photoelectron spectroscopy (XPS).

Publications

"Correlation Between HOMO Alignment and Contact Resistance in Molecular Junctions: Aromatic Thiols versus Aromatic Isocyanides," Kim, B.; Beebe, J. M.; Jun, Y.; Zhu, X-Y.; Frisbie, C. D., J. Am. Chem. Soc. 2006, 128 4970.

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