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CEMS > Research > Labs & Centers

Laboratories and Research Centers

In addition to their own research labs, CEMS researchers have access to other laboratories and research facilities associated with the University of Minnesota.


  • Supercomputing Institute

    The Supercomputing Institute is an interdisciplinary research program of the University of Minnesota.  It offers facilities, including hardware and software, for digital simulations and advanced computation.  In addition, it provides some office space, travel awards and research scholarships.
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  • Nanofabrication Center

    The Nanofabrication Center is an interdisciplinary center offering training and equipment to support research in microelectronics and nanofabrication
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  • Industrial Partnership for Research in Interfacial and Materials Engineering

    IPRIME is a descendant of the NSF-sponsored Center for Interfacial Engineering. Today it is sponsored entirely by industrial contributions, and along with MRSEC, is one of the main driving forces for collaborative research at the University of Minnesota.
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  • Materials Research Science and Engineering Center

    The University of Minnesota Materials Research Science & Engineering Center (MRSEC) is an NSF-sponsored multidisciplinary center involving approximately 100 faculty and students from seven departments within IT.
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  • Polymer Characterization Facility

    The Polymer Characterization Facility offers training and instruments for advanced rheological and thermal measurements of polymers.  It is available to all researchers.
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  • Coating Process Laboratory

    The Coating Process Laboratory is equipped with instruments and high speed cameras for measuring and visualizing phenomena associated with coating processes.  It is available to all researchers.
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  • Institute of Technology Characterization Facility

    The IT Characterization Facility is a shared instrumentation facility for materials research.  It includes scanning and electron microscopes, atomic force microscopes, light microscopes, spectrometers, x-ray diffraction and scattering, and thin-film analysis instruments.
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