June 16, 2016
- Associate Professor Andre Mkhoyan has been awarded a grant through the Research Infrastructure Investment Program for the acquisition of a state-of-the-art, combined focus ion beam and scanning electron microscope system (FIB/SEM Dual-Beam) to fill a critical need for the U’s Characterization Facility. Mkhoyan's proposal received significant financial support from the Department of Earth Sciences, Department of Electrical and Computer Engineering, Department of Chemical Engineering and Materials Science, Material Research Science and Engineering Center, Characterization Facility, and College of Science and Engineering Dean’s Office.
This system will dramatically improve the U of M’s role as one of the leaders in nanotechnology research. This FIB/SEM Dual-Beam system will make previously inaccessible scientific study possible, allowing researchers to push the limits of understanding of the fundamentals of nanoscale materials through nanoscale cutting, patterning and manipulating a wide range of materials with parallel SEM-based, high resolution imaging and spectroscopy. The new instrument will be installed in the Characterization Facility and be accessible to all researchers within the University of Minnesota community.
Related Link: http://www.research.umn.edu/advance/RIIP-2016-awards.html